The Control of Electron Transport Related Defects in In Situ Fabricated Single Wall Carbon Nanotube Devices... Journal September, 2006
Normal-Incidence Generalized Ellipsometry using the Two-Modulator Generalized Ellipsometry Microscope Journal August, 2006
Spatial Resolution, Information Limit, and Contrast Transfer in Piezoresponse Force Microscopy... Journal July, 2006
Effect of Strain on Structure and Charge Order Transitions in Epitaxial Bi0.4Ca0.6MnO3 Films... Journal May, 2006
