1 - 10 of 46 Results
We have developed a novel extrusion-based 3D printing technique that can achieve a resolution of 0.51 mm layer thickness, and catalyst loading of 44% and 90.5% before and after drying, respectively.
Dual-GP addresses limitations in traditional GPBO-driven autonomous experimentation by incorporating an additional surrogate observer and allowing human oversight, this technique improves optimization efficiency via data quality assessment and adaptability to unanticipated exp
This manufacturing method uses multifunctional materials distributed volumetrically to generate a stiffness-based architecture, where continuous surfaces can be created from flat, rapidly produced geometries.
The lack of real-time insights into how materials evolve during laser powder bed fusion has limited the adoption by inhibiting part qualification. The developed approach provides key data needed to fabricate born qualified parts.
This invention is directed to a machine leaning methodology to quantify the association of a set of input variables to a set of output variables, specifically for the one-to-many scenarios in which the output exhibits a range of variations under the same replicated input condi
The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.
The use of biomass fiber reinforcement for polymer composite applications, like those in buildings or automotive, has expanded rapidly due to the low cost, high stiffness, and inherent renewability of these materials. Biomass are commonly disposed of as waste.
High coercive fields prevalent in wurtzite ferroelectrics present a significant challenge, as they hinder efficient polarization switching, which is essential for microelectronic applications.
Scanning transmission electron microscopes are useful for a variety of applications. Atomic defects in materials are critical for areas such as quantum photonics, magnetic storage, and catalysis.
Distortion in scanning tunneling microscope (STM) images is an unavoidable problem. This technology is an algorithm to identify and correct distorted wavefronts in atomic resolution STM images.