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Researcher
- Rama K Vasudevan
- Ryan Dehoff
- Sergei V Kalinin
- Yongtao Liu
- Kevin M Roccapriore
- Kyle Kelley
- Maxim A Ziatdinov
- Olga S Ovchinnikova
- Sam Hollifield
- Chad Steed
- Junghoon Chae
- Kashif Nawaz
- Michael Kirka
- Mingyan Li
- Stephen Jesse
- Travis Humble
- Vincent Paquit
- Aaron Werth
- Adam Stevens
- Ahmed Hassen
- Alex Plotkowski
- Alice Perrin
- Ali Passian
- Amir K Ziabari
- Amit Shyam
- An-Ping Li
- Andres Marquez Rossy
- Andrew Lupini
- Anton Ievlev
- Arpan Biswas
- Benjamin Lawrie
- Blane Fillingim
- Bogdan Dryzhakov
- Brian Fricke
- Brian Post
- Brian Weber
- Chengyun Hua
- Christopher Ledford
- Christopher Rouleau
- Clay Leach
- Costas Tsouris
- David Nuttall
- Debangshu Mukherjee
- Emilio Piesciorovsky
- Gabor Halasz
- Gary Hahn
- Gerd Duscher
- Gs Jung
- Gyoung Gug Jang
- Harper Jordan
- Hoyeon Jeon
- Huixin (anna) Jiang
- Ilia N Ivanov
- Isaac Sikkema
- Ivan Vlassiouk
- James Haley
- Jamieson Brechtl
- Jason Jarnagin
- Jewook Park
- Jiaqiang Yan
- Joel Asiamah
- Joel Dawson
- Jong K Keum
- Joseph Olatt
- Kai Li
- Kevin Spakes
- Kunal Mondal
- Kyle Gluesenkamp
- Liam Collins
- Lilian V Swann
- Luke Koch
- Mahim Mathur
- Mahshid Ahmadi-Kalinina
- Mark Provo II
- Marti Checa Nualart
- Mary A Adkisson
- Md Inzamam Ul Haque
- Mina Yoon
- Nance Ericson
- Neus Domingo Marimon
- Nickolay Lavrik
- Ondrej Dyck
- Oscar Martinez
- Patxi Fernandez-Zelaia
- Peeyush Nandwana
- Petro Maksymovych
- Philip Bingham
- Radu Custelcean
- Rangasayee Kannan
- Raymond Borges Hink
- Rob Root
- Roger G Miller
- Saban Hus
- Sai Mani Prudhvi Valleti
- Samudra Dasgupta
- Sarah Graham
- Srikanth Yoginath
- Steven Randolph
- Sudarsanam Babu
- Sumner Harris
- T Oesch
- Utkarsh Pratiush
- Varisara Tansakul
- Venkatakrishnan Singanallur Vaidyanathan
- Vipin Kumar
- Vlastimil Kunc
- William Peter
- Xiaobing Liu
- Yan-Ru Lin
- Yarom Polsky
- Ying Yang
- Yukinori Yamamoto
- Zhiming Gao

Simurgh revolutionizes industrial CT imaging with AI, enhancing speed and accuracy in nondestructive testing for complex parts, reducing costs.

This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.

An innovative low-cost system for in-situ monitoring of strain and temperature during directed energy deposition.

This innovative approach combines optical and spectral imaging data via machine learning to accurately predict cancer labels directly from tissue images.

This technology introduces an advanced machine learning approach for enhancing chemical imaging by correlating data from two mass spectrometry imaging (MSI) techniques.

A high-strength, heat-resistant Al-Ce-Ni alloy optimized for additive manufacturing in industrial applications.
Aromas play a significant role in the quality and safety of food, beverages, and even manufactured products. The ability to detect and interpret these aromas accurately can enhance product safety and consumer satisfaction.