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The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.
High coercive fields prevalent in wurtzite ferroelectrics present a significant challenge, as they hinder efficient polarization switching, which is essential for microelectronic applications.
Through the use of splicing methods, joining two different fiber types in the tow stage of the process enables great benefits to the strength of the material change.
Real-time tracking and monitoring of radioactive/nuclear materials during transportation is a critical need to ensure safety and security. Current technologies rely on simple tagging, using sensors attached to transport containers, but they have limitations.
This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.
This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.