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Researcher
- Alex Plotkowski
- Amit Shyam
- Kyle Kelley
- Rama K Vasudevan
- James A Haynes
- Sergei V Kalinin
- Sumit Bahl
- Alice Perrin
- Andres Marquez Rossy
- Anton Ievlev
- Bogdan Dryzhakov
- Bruce Moyer
- Debjani Pal
- Gerry Knapp
- Jeffrey Einkauf
- Jennifer M Pyles
- Jovid Rakhmonov
- Kevin M Roccapriore
- Kuntal De
- Laetitia H Delmau
- Liam Collins
- Luke Sadergaski
- Marti Checa Nualart
- Maxim A Ziatdinov
- Neus Domingo Marimon
- Nicholas Richter
- Olga S Ovchinnikova
- Peeyush Nandwana
- Ryan Dehoff
- Stephen Jesse
- Steven Randolph
- Sunyong Kwon
- Ying Yang
- Yongtao Liu

Ruthenium is recovered from used nuclear fuel in an oxidizing environment by depositing the volatile RuO4 species onto a polymeric substrate.

Currently available cast Al alloys are not suitable for various high-performance conductor applications, such as rotor, inverter, windings, busbar, heat exchangers/sinks, etc.

The invented alloys are a new family of Al-Mg alloys. This new family of Al-based alloys demonstrate an excellent ductility (10 簣 2 % elongation) despite the high content of impurities commonly observed in recycled aluminum.

The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.

High coercive fields prevalent in wurtzite ferroelectrics present a significant challenge, as they hinder efficient polarization switching, which is essential for microelectronic applications.

This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.

This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.

A high-strength, heat-resistant Al-Ce-Ni alloy optimized for additive manufacturing in industrial applications.

An ORNL team has developed a method for screening for an immunoregulatory protein, which includes assessing the sequence of a candidate protein to determine if it is an immunoregulatory protein when at least one plasminogen-apple-nematode (PAN) domain with a consensus sequence