Multi-Modal Processing of Graphene Towards Precisely Controlled Fabrication of a Nanoelectronic Device Using the Helium Ion Microscope and the TOF SIMS

Publication

Publication Type

Conference Paper

Journal Name

Microscopy and Microanalysis

Publication Date

July, 2017

Page Numbers

1720 to 1721

Volume

Issue

Conference Name

Microscopy & Microanalysis (M&M) 2017 Conference

Conference Location

St. Louis, Missouri, United States of America

Conference Date

Aug 6, 2017 - Aug 10, 2017

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