Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene Journal December, 2020
A Library of Atomically Thin 2D Materials Featuring the Conductive‐Point Resistive Switching Phenomenon Journal December, 2020
Realizing gapped surface states in the magnetic topological insulator MnBi2−xSbxTe4 Journal September, 2020
Unusual electrical conductivity driven by localized stoichiometry modification at vertical epitaxial interfaces Journal September, 2020
Tracking ion intercalation into layered Ti 3 C 2 MXene films across length scales Journal August, 2020
Facile Size-Selective Defect Sealing in Large-Area Atomically Thin Graphene Membranes for Sub-Nanometer Scale Separations Journal July, 2020
